Sequential Circuit Test Generation in a Genetic Algorithm Framework I Introduction

  • FrameworkElizabeth M. Rudnick Janak H. Patel Gary S. Greenstein Thomas M. NiermannCenter
  • Published 1994
|Test generation using deterministic fault-oriented algorithms is highly complex and time-consuming. New approaches are needed to augment the existing techniques, both to reduce execution time and to improve fault coverage. In this work, we describe a genetic algorithm (GA) framework for sequential circuit test generation. The GA evolves candidate test… CONTINUE READING