Sensing margin analysis of MLC flash memories using a novel unified statistical model

@article{Kim2006SensingMA,
  title={Sensing margin analysis of MLC flash memories using a novel unified statistical model},
  author={Young-Gu Kim and Sang-Hoon Lee and Dae-Han Kim and Jae-Woo Im and Sung-Eun Yu and Dae-Wook Kim and Young-Kwan Park and Jeong-Taek Kong},
  journal={7th International Symposium on Quality Electronic Design (ISQED'06)},
  year={2006},
  pages={5 pp.-189}
}
A multilevel level cell (MLC) technique for flash memories reduces the bit cost and enhances the memory density. However, it is difficult to get a required sensing margin for MLC due to the need for the tight threshold voltage control. We present a novel unified statistical model which can account for interand intra-die variations. The proposed model is implemented into SPICE to predict the distribution of performance. The sensing margin is found to increase by about 30% with optimization of… CONTINUE READING