Self-repairing adder using fault localization

  title={Self-repairing adder using fault localization},
  author={Muhammad Ali Akbar and Jeong-A Lee},
  journal={Microelectronics Reliability},
Keywords: Self-checking adder Carry-select adder Fault localization Self-repairing adder Multiple faults a b s t r a c t In this paper we propose an area-efficient self-repairing adder that can repair multiple faults and identify the particular faulty full adder. Fault detection and recovery has been carried out using self-checking full adders that can diagnose the fault based on internal functionality, independent of a fault propagated through carry. The idea was motivated by the common design… CONTINUE READING


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Publications referenced by this paper.
Showing 1-10 of 19 references

Self-Checking Carry-Select Adder Design Based on Two-Rail Encoding

IEEE Transactions on Circuits and Systems I: Regular Papers • 2007
View 20 Excerpts
Highly Influenced

Virtual TMR Schemes Combining Fault Tolerance and Self Repair

2013 Euromicro Conference on Digital System Design • 2013
View 1 Excerpt

CrashTest'ing SWAT: Accurate, gate-level evaluation of symptom-based resiliency solutions

2012 Design, Automation & Test in Europe Conference & Exhibition (DATE) • 2012
View 1 Excerpt

Fault Tolerant ALU System

2012 International Conference on Computing Sciences • 2012
View 2 Excerpts

Concurrent Error Detection Adder Based on Two Paths Output Computation

2011 IEEE Ninth International Symposium on Parallel and Distributed Processing with Applications Workshops • 2011
View 3 Excerpts

On the Feasibility of Built-In Self Repair for Logic Circuits

2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems • 2011

A simple fault-tolerant digital voter circuit in TMR nanoarchitectures

Proceedings of the 8th IEEE International NEWCAS Conference 2010 • 2010

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