Self-heating and its implications on hot carrier reliability evaluations


Device level Self-Heating (SH) is becoming a limiting factor during traditional DC Hot Carrier stresses in bulk and SOI technologies. Consideration is given to device layout and design for Self-Heating minimization during HCI stress in SOI technologies, the effect of SH on activation energy (Ea) and the SH induced enhancement to degradation. Applying a… (More)
DOI: 10.1109/IRPS.2015.7112726


12 Figures and Tables


Citations per Year

Citation Velocity: 15

Averaging 15 citations per year over the last 3 years.

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