Self-checking test circuits for latches and flip-flops

  title={Self-checking test circuits for latches and flip-flops},
  author={Renato P. Ribas and Yuyang Sun and Andr{\'e} In{\'a}cio Reis and Andr{\'e} Ivanov},
  journal={2011 IEEE 17th International On-Line Testing Symposium},
This work proposes design strategies applicable to self-test circuits for the functional validation of latches and flip-flops. The proposed methodology is also useful for, delay test and power consumption analysis that can also be performed over the circuits under test. Moreover, the evaluation of the impacts on circuit operation due to power supply… CONTINUE READING