Self-Test and Adaptation for Random Variations in Reliability

Abstract

Random physical variations and noise are growing challenges for advanced electronic systems. Field programmable systems can, in principle, adapt to these phenomena, but two main problems must be addressed: how to efficiently characterize random variations and how to perform subsequent optimization. This paper addresses both of these questions. First, an… (More)
DOI: 10.1109/FPL.2010.47

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Cite this paper

@article{Zick2010SelfTestAA, title={Self-Test and Adaptation for Random Variations in Reliability}, author={Kenneth M. Zick and John P. Hayes}, journal={2010 International Conference on Field Programmable Logic and Applications}, year={2010}, pages={193-198} }