Selective electron spin resonance measurements of micrometer-scale thin samples on a substrate

  title={Selective electron spin resonance measurements of micrometer-scale thin samples on a substrate},
  author={Ekaterina Dikarov and Matthias J. Fehr and Alexander Schnegg and Klaus Lips and Aharon Blank},
  journal={Measurement Science and Technology},
An approach to the selective observation of paramagnetic centers in thin samples or surfaces with electron spin resonance (ESR) is presented. The methodology is based on the use of a surface microresonator that enables the selective obtention of ESR data from thin layers with minimal background signals from the supporting substrate. An experimental example is provided, which measures the ESR signal from a 1.2 µm polycrystalline silicon layer on a glass substrate used in modern solar-cell… Expand

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