Seebeck coefficient of nanowires interconnected into large area networks.

Abstract

We measured the macroscopic Seebeck coefficient of silicon nanowires (SiNWs), organized in a highly interconnected networks on large areas (order of mm(2)). The fabricated networks are very reliable with respect to random nanowire failure and are electrically and thermally equivalent to many SiNWs placed in parallel between the electrical contacts. The… (More)

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