Securing Designs against Scan-Based Side-Channel Attacks

  title={Securing Designs against Scan-Based Side-Channel Attacks},
  author={Jeremy Lee and Mark Mohammad Tehranipoor and Chintan Patel and James F. Plusquellic},
  journal={IEEE Transactions on Dependable and Secure Computing},
Traditionally, the only standard method of testing that has consistently provided high fault coverage has been scan test due to the high controllability and high observability this technique provides. The scan chains used in scan test not only allow test engineers to control and observe a chip, but these properties also allow the scan architecture to be used as a means to breach chip security. In this paper, we propose a technique, called Lock & Key, to neutralize the potential for scan-based… CONTINUE READING
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