Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study

  title={Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study},
  author={Adit D. Singh and Phil Nigh and C. Mani Krishna},
for MCMs, and high-reliability applications. Further, defect clustering based strategies may dso be able to screen for potential burn-in failures, thereby eliminating the need for expensive burn-in of bare dice. Finally, this approach is orthogonal to other techniques for improving test effectiveness, and can screen for de(UP to an order of magnitude) better than can be otherwise achieved without exploiting defect clustering information. Because of the difficulty of obtaining actual defect map… CONTINUE READING
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On the Probability of Fault Occurrence,

  • V. D. Agrawal
  • Defect and Fault-Tolerance in VLSZ Systems, New…
  • 1989

Correlation Analysis of Particle Clusters on Integrated Circuit Wafers

  • C. M. Krishna
  • An Empirical Relationship Between Test…
  • 1987

Defect Level as a h c

  • T. W. Williams, N. C. Brown
  • 1981

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