Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study

@inproceedings{Singh1997ScreeningFK,
  title={Screening for Known Good Die (KGD) Based on Defect Clustering: An Experimental Study},
  author={Adit D. Singh and Phil Nigh and C. Mani Krishna},
  booktitle={ITC},
  year={1997}
}
for MCMs, and high-reliability applications. Further, defect clustering based strategies may dso be able to screen for potential burn-in failures, thereby eliminating the need for expensive burn-in of bare dice. Finally, this approach is orthogonal to other techniques for improving test effectiveness, and can screen for de(UP to an order of magnitude) better than can be otherwise achieved without exploiting defect clustering information. Because of the difficulty of obtaining actual defect map… CONTINUE READING
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