Screening customer returns with multivariate test analysis


This work studies the potential of capturing customer returns with models constructed based on multivariate analysis of parametric wafer sort test measurements. In such an analysis, subsets of tests are selected to build models for making pass/fail decisions. Two approaches are considered. A preemptive approach selects correlated tests to construct… (More)
DOI: 10.1109/TEST.2012.6401547


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Citations per Year

Citation Velocity: 13

Averaging 13 citations per year over the last 3 years.

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