• Corpus ID: 220347200

Scattering contrast in GHz frequency ultrasound subsurface atomic force microscopy for detection of deeply buried features

@article{Es2020ScatteringCI,
  title={Scattering contrast in GHz frequency ultrasound subsurface atomic force microscopy for detection of deeply buried features},
  author={Maarten H. van Es and B.A.J. Quesson and Abbas Mohtashami and Daniele Piras and Kodai Hatakeyama and Laurent Fillinger and Paul L.M.J. van Neer Optomechatronics and Tno and Delft and The Netherlands. and Acoustics and Sonar and Theresa Hague},
  journal={arXiv: Applied Physics},
  year={2020}
}
While Atomic Force Microscopy is mostly used to investigate surface properties, people have almost since its invention sought to apply its high resolution capability to image also structures buried within samples. One of the earliest techniques for this was based on using ultrasound excitations to visualize local differences in effective tip-sample stiffness caused by the presence of buried structures with different visco-elasticity from their surroundings. While the use of ultrasound has often… 
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