Scanning ultrafast electron microscopy.

@article{Yang2010ScanningUE,
  title={Scanning ultrafast electron microscopy.},
  author={Ding-Shyue Yang and Omar Fouad Mohammed and Ahmed H. Zewail},
  journal={Proceedings of the National Academy of Sciences of the United States of America},
  year={2010},
  volume={107 34},
  pages={
          14993-8
        }
}
Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here, we report the development of scanning ultrafast electron microscopy using a field-emission-source configuration. Scanning of pulses is made in the single-electron mode, for which… CONTINUE READING
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