Scanning tunneling spectroscopy and ballistic electron emission microscopy studies of aluminum-oxide surfaces

Abstract

We report scanning tunneling microscopy ~STM! results that reveal localized features on the exposed surface of amorphous aluminum oxide that are regularly present but which cannot be uniquely identified with STM as electronic defects or surface adsorbents. With the simultaneous use of ballistic electron emission microscopy ~BEEM! we can examine the… (More)

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@inproceedings{Perrella2002ScanningTS, title={Scanning tunneling spectroscopy and ballistic electron emission microscopy studies of aluminum-oxide surfaces}, author={Andrew Perrella and W. H. Rippard and P. G. Mather and Monica Plisch and R. A. Buhrman}, year={2002} }