Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.

@article{Liu2005ScanningTE,
  title={Scanning transmission electron microscopy and its application to the study of nanoparticles and nanoparticle systems.},
  author={Jingyue Jimmy Liu},
  journal={Journal of electron microscopy},
  year={2005},
  volume={54 3},
  pages={251-78}
}
Scanning transmission electron microscopy (STEM) techniques can provide imaging, diffraction and spectroscopic information, either simultaneously or in a serial manner, of the specimen with an atomic or a sub-nanometer spatial resolution. High-resolution STEM imaging, when combined with nanodiffraction, atomic resolution electron energy-loss spectroscopy and nanometer resolution X-ray energy dispersive spectroscopy techniques, is critical to the fundamental studies of importance to nanoscience… CONTINUE READING
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