Scanning Single-Electron Transistor Microscopy: Imaging Individual Charges


A single-electron transistor scanning electrometer (SETSE)-a scanned probe microscope capable of mapping static electric fields and charges with 100-nanometer spatial resolution and a charge sensitivity of a small fraction of an electron-has been developed. The active sensing element of the SETSE, a single-electron transistor fabricated at the end of a… (More)



Citations per Year

81 Citations

Semantic Scholar estimates that this publication has 81 citations based on the available data.

See our FAQ for additional information.

  • Blog articles referencing this paper

  • Presentations referencing similar topics