Scanning Probe Microscopy

@article{Salapaka2008ScanningPM,
  title={Scanning Probe Microscopy},
  author={Srinivasa M. Salapaka and Murti V. Salapaka},
  journal={IEEE Control Systems},
  year={2008},
  volume={28},
  pages={65-83}
}
This article describes new perspectives on SPM-related science and technology, based on systems and control theory. These perspectives have led to a better understanding of SPM technology, overcome hurdles that limited the efficacy of SPM, and resulted in new modes of SPM-based interrogation. ThNcAFM, based on systems principles, has made it possible to image with resolution as high as 0.25 Aring in ambient conditions. The orders-of-magnitude improvements achieved in areas such as precision… Expand
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