Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy

  title={Scanning Probe Microscopy: Atomic Force Microscopy and Scanning Tunneling Microscopy},
  author={Bert Voigtl{\"a}nder},
  journal={Scanning Probe Microscopy},
Introduction.- Harmonic Oscillator.- Technical Aspects of Scanning Probe Microscopy.- Scanning Probe Microscopy Designs.- Electronics for Scanning Probe Microscopy.- Lock-In Technique.- Data Representation and Image Processing.- Artifacts in SPM.- Work Function, Contact Potential, and Kelvin Probe Scanning Force Microscopy.- Surface States.- Forces Between Tip and Sample.- Technical Aspects of Atomic force Microscopy (AFM).- Static Atomic Force Microscopy.- Amplitude Modulation (AM) Mode in… Expand

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