Scanning Microwave Microscope

@inproceedings{Serry2008ScanningMM,
  title={Scanning Microwave Microscope},
  author={Fathy M. E. Serry},
  year={2008}
}
Introduction Measuring electromagnetic properties of materials can provide insight into applications in many areas of science and technology, and increasingly, these properties need to be evaluated at the nanometer scale. Since electromagnetic properties, such as the dielectric constant, are ultimately related to a material’s molecular structure, correlating the detailed physical structure of a material with its electromagnetic properties is frequently more valuable than the knowledge of either… CONTINUE READING

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