Scanning Electron and Atomic Force Microscopy to Study Plasma Torch Effects on B. cereus Spores

@article{Tarasenko2006ScanningEA,
  title={Scanning Electron and Atomic Force Microscopy to Study Plasma Torch Effects on B. cereus Spores},
  author={Olga Tarasenko and Shirin Nourbakhsh and S. P. Kuo and Asya Bakhtina and Pierre Alusta and Dina S Kudasheva and Mary K. Cowman and Kalle Lev{\'o}n},
  journal={IEEE Transactions on Plasma Science},
  year={2006},
  volume={34},
  pages={1281-1289}
}
The occurrence of scanning electron microscopy (SEM) and atomic force microscopy (AFM) side-by-side is becoming increasingly common in analytical research. This article shows microscopy techniques to image Bacillus spores, to measure spore dimensions, and to demonstrate how these methods provide supplementary information to study plasma torch effects. This paper demonstrates that observed morphologies of spores before and after exposure to a plasma torch are remarkably different. The use of SEM… CONTINUE READING