Scan-based ATPG diagnostic and optical techniques combination: A new approach to improve accuracy of defect isolation in functional logic failure


Nowadays, with the increasing complexity of new VLSI circuits, laser stimulation or emission techniques and scan-based ATPG diagnostic reach their limits in functional logic failure. To overcome these limitations, a new methodology has been established. This methodology, presented in this paper, combines the advantages of both approaches in order to improve… (More)


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