Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges

@inproceedings{Saxena2002ScanBasedTF,
  title={Scan-Based Transition Fault Testing - Implementation and Low Cost Test Challenges},
  author={Jayashree Saxena and Kenneth M. Butler and John Gatt and R. Raghuraman and Sudheendra Phani Kumar and Supatra Basu and David J. Campbell and John Berech},
  booktitle={ITC},
  year={2002}
}
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