Scaling of stack effect and its application for leakage reduction

Abstract

Technology scaling demands a decrease in both Vdd and Vt to sustain historical delay reduction, while restraining active power dissipation. Scaling of Vt however leads to substantial increase in the sub-threshold leakage power and is expected to become a considerable constituent of the total dissipated power. It has been observed that the stacking of two… (More)
DOI: 10.1145/383082.383132

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