Scaling analysis of yield optimization considering supply and threshold voltage variations

@article{Haghdad2010ScalingAO,
  title={Scaling analysis of yield optimization considering supply and threshold voltage variations},
  author={Kian Haghdad and Mohab Anis},
  journal={Proceedings of 2010 IEEE International Symposium on Circuits and Systems},
  year={2010},
  pages={3665-3668}
}
Parametric yield loss has become a significant issue in the design of nanometer integrated circuits (IC). In this paper, the impact of supply (Vdd) and threshold voltage (Vth) variations on the yield loss for the current and future CMOS technologies is investigated. The results demonstrate that, despite the temporary improvement due to the use of high-k… CONTINUE READING