Scalable Adaptive Scan (SAS)

  title={Scalable Adaptive Scan (SAS)},
  author={Anshuman Chandra and Rohit Kapur and Yasunari Kanzawa},
  journal={2009 Design, Automation & Test in Europe Conference & Exhibition},
Scan compression has emerged as the most successful solution to solve the problem of rising manufacturing test cost. Compression technology is not hierarchical in nature. Hierarchical implementations need test access mechanisms that keep the isolation between the different tests applied through the different compressors and decompressors. In this paper we discuss a test access mechanism for Adaptive Scan that addresses the problem of reducing test data and test application time in a… CONTINUE READING
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