SU-E-T-231: Comparison of Beam Characteristics of Small Field 6 MeV Electrons as Replacement for Superficial X Ray Beam.


PURPOSE To compare beam characteristics of superficial X-rays with 6 MeV Electrons for the purpose of replacing superficial treatments with electron fields for skin lesions. METHODS Electron beam cutouts were made with 12mm thickness cerrobend in diameters 2-5 cm to match superficial X-ray machine cones. Central axis depth doses and profiles were… (More)
DOI: 10.1118/1.4735294


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