STIL: the device-oriented database for the test development lifecycle

@article{Biggs1999STILTD,
  title={STIL: the device-oriented database for the test development lifecycle},
  author={Nathan Biggs},
  journal={International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034)},
  year={1999},
  pages={1149-}
}
STIL is uniquely positioned among the plethora of circuit interaction databases offered by the various EDA and ATE companies because of its device-oriented approach to data representation. This freedom from platform allegiance allows STIL to be used at any, or all, of the stages of the product test development lifecycle. 

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