SSTKR: Secure and Testable Scan Design through Test Key Randomization

  title={SSTKR: Secure and Testable Scan Design through Test Key Randomization},
  author={Mohammed Abdul Razzaq and Virendra Singh and Adit D. Singh},
  journal={2011 Asian Test Symposium},
Scan test is the standard method, practiced by industry, that has consistently provided high fault coverage due to high controllability and high observability. The scan chain allows to control and observe the internal signals of a chip. However, this property also facilitates hackers to use scan architecture as a means to breach chip security. This paper addresses this issue by proposing a new method called Secure and testable Scan design through Test Key Randomization(SSTKR). SSTKR is a key… CONTINUE READING
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