SIMS-Untersuchungen zum Einfluß von Oberflächenschichten auf die Wasserstoffdurchlässigkeit von Tantal-Folien

@inproceedings{Zchner1974SIMSUntersuchungenZE,
  title={SIMS-Untersuchungen zum Einflu{\ss} von Oberfl{\"a}chenschichten auf die Wasserstoffdurchl{\"a}ssigkeit von Tantal-Folien},
  author={Harald Z{\"u}chner and N. Boes},
  year={1974}
}
The technique of secondary ion mass spectrometry (SIMS) is used to get informations about surface layers of tantalum foils which retard the hydrogen penetration, and about the elimination of these layers by outgassing the foils in ultrahigh vacuum at high temperatures and subsequent coating with a vapor deposited thin film of palladium. The SIMS-investigation shows, that it is possible to eliminate oxygen and carbon almost entirely and also some other bulk impurities by the outgassing procedure… CONTINUE READING