SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry

@inproceedings{Pollinger2016SITraceableHE,
  title={SI-Traceable High-Accuracy EDM based on Multi-Wavelength Interferometry},
  author={Florian Pollinger and Justyna Mildner and Paul K{\"o}chert and Run-ling Yang and Admira Bosnjakovic and Thorsten Meyer and Martin Wedde and Karl Meiners-Hagen},
  year={2016}
}
An electro-optical distance measurement with an uncertainty below 1 ppm over distances of several hundreds of metres requires two challenges to be overcome: for once, the optical distance measurement must be performed with a respective measurement precision, and in addition, the index of refraction needs to be determined at the same level of uncertainty… CONTINUE READING