SEU tolerant SRAM for FPGA applications


Modern integrated circuits require careful attention to the soft errors resulting into bit upsets, which are normally caused by alpha particle or neutron hits. These events, also referred to as single-event upsets (SEUs), will become more severe for future technologies. LUT-based FPGAs are heavily using SRAM and there is a growing concern on correct… (More)
DOI: 10.1109/FPT.2010.5681465


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