SEFI cross-section evaluation by fault injection software approach and hardware detection

@article{Loskutov2017SEFICE,
  title={SEFI cross-section evaluation by fault injection software approach and hardware detection},
  author={I. O. Loskutov and P. V. Nekrasov and I. I. Shvetsov-Shilovskiy and D. V. Boychenko and V. M. Uzhegov},
  journal={2017 IEEE 30th International Conference on Microelectronics (MIEL)},
  year={2017},
  pages={251-254}
}
This paper presents the system that allows SEFI modelling by means of injecting upsets in different microcontroller memory blocks, carrying out its functional control and detect the moment when SEFI occurs. Test setup was developed on the basis of National Instruments PXI modular equipment and LabVIEW software. Developed fault injection system was tested on PIC17 microcontroller. The comparison between simulation results and ground tests is presented. 

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