## IEEE NSREC REDW Proceedings

- A Kenna, B Rax, D Thorbourn, R Harris, S Mcclure
- IEEE NSREC REDW Proceedings
- 2009

@article{George2016SEEAT, title={SEE and TID Effects in Transistors and Voltage Reference Devices}, author={John S. George and J. R. Srour and Michael A. Tockstein and Bill Kwan and Andrew Firmin Macclesfield Wright and Jessica Bonsall and Ryuji Koga and Stanley Clinton Davis}, journal={2016 IEEE Radiation Effects Data Workshop (REDW)}, year={2016}, pages={1-8} }

- Published in IEEE Radiation Effects Data Workshop (REDW) 2016
DOI:10.1109/NSREC.2016.7891732