SCID-PANSS: two-tier diagnostic system for psychotic disorders.

@article{Kay1991SCIDPANSSTD,
  title={SCID-PANSS: two-tier diagnostic system for psychotic disorders.},
  author={Stanley R. Kay and Lewis A. Opler and Robert L. Spitzer and Janet B. W. Williams and Ariel Fiszbein and A Gorelick},
  journal={Comprehensive psychiatry},
  year={1991},
  volume={32 4},
  pages={355-61}
}
The SCID-PANSS was developed as a two-tier diagnostic system for psychotic disorders to supplement categorical diagnosis with functional-dimensional assessment. The procedure combines the DSM-III-R Structured Clinical Interview and Rating Criteria (SCID) with those from the Positive and Negative Syndrome Scale (PANSS). The comprehensive 50- to 60-minute interview yields diagnostic classification, plus a profile of 30 symptoms and 10 dimensional scales, including positive and negative syndromes… CONTINUE READING

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