SAT-based analysis of sensitisable paths

@article{Sauer2011SATbasedAO,
  title={SAT-based analysis of sensitisable paths},
  author={Matthias Sauer and Alexander Czutro and Tobias Schubert and Stefan Hillebrecht and Ilia Polian and Bernd Becker},
  journal={14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems},
  year={2011},
  pages={93-98}
}
Manufacturing defects in nanoscale technologies have highly complex timing behaviour that is also affected by process variations. While conventional wisdom suggests that it is optimal to detect a delay defect through the longest sensitisable path, non-trivial defect behaviour along with modelling inaccuracies necessitate consideration of paths of well-controlled length during test generation. We present a generic methodology that yields tests through all sensitisable paths of user-specified… CONTINUE READING

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