Robust tests for stuck-open faults in cmos combinational logic circuits

@inproceedings{Reddy1984RobustTF,
  title={Robust tests for stuck-open faults in cmos combinational logic circuits},
  author={S. M. Reddy and Madhukar K. Reddy and Vishwani D. Agrawal},
  year={1984}
}
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