Robust switch-level test generation

Abstract

Metal oxide semiconductor (MOS) technology is highly popular currently due to the many advantages that it provides. It has been shown that conventional methods of testing are not applicable to MOS circuits. A switch-level model is used to generate a sequence of test vectors for a variety of MOS circuits, including those containing pass transistor logic… (More)
DOI: 10.1109/VTEST.1992.232733

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