Robust System Design to Overcome CMOS Reliability Challenges

  title={Robust System Design to Overcome CMOS Reliability Challenges},
  author={Subhasish Mitra and Kevin Brelsford and Young Moon Kim and Hsiao-Heng Lee and Yanjing Li},
  journal={IEEE Journal on Emerging and Selected Topics in Circuits and Systems},
Today's mainstream electronic systems typically assume that transistors and interconnects operate correctly over their useful lifetime. With enormous complexity and significantly increased vulnerability to failures compared to the past, future system designs cannot rely on such assumptions. For coming generations of silicon technologies, several causes of hardware reliability failures, largely benign in the past, are becoming significant at the system level. Robust system design is essential to… CONTINUE READING
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