RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits

@article{Binu2019RideNNAN,
  title={RideNN: A New Rider Optimization Algorithm-Based Neural Network for Fault Diagnosis in Analog Circuits},
  author={D. Binu and B. S. Kariyappa},
  journal={IEEE Transactions on Instrumentation and Measurement},
  year={2019},
  volume={68},
  pages={2-26}
}
  • D. Binu, B. Kariyappa
  • Published 2019
  • Computer Science
  • IEEE Transactions on Instrumentation and Measurement
Fault diagnosis in electronic circuits is an emerging area of research, where fully automated diagnosis systems are being developed for the investigation of the circuits. Developing test methods for the diagnosis of faults in analog circuits is still a complex task. Consequently, a technique for the fault diagnosis in analog circuits is designed by proposing a new optimization algorithm, named, rider optimization algorithm (ROA). The development of ROA is based on a group of riders, racing… Expand
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