Review of recent advances in spectrum imaging and its extension to reciprocal space.

Abstract

Using examples from various domains of science, this review covers some recent developments in spectrum imaging (SI) using scanning transmission electron microscopy (STEM) and electron energy loss spectroscopy (EELS). Advanced multi-dimensional acquisition methods allow the acquisition of STEM-EELS data with other complementary data such as energy… (More)
DOI: 10.1093/jmicro/dfp022

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Cite this paper

@article{Maign2009ReviewOR, title={Review of recent advances in spectrum imaging and its extension to reciprocal space.}, author={Alan Maign{\'e} and Ray D. Twesten}, journal={Journal of electron microscopy}, year={2009}, volume={58 3}, pages={99-109} }