Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique

@article{Chen2007ResponseIS,
  title={Response Inversion Scan Cell (RISC): A Peak Capture Power Reduction Technique},
  author={B C Chen and Wei-Chung Kao and Bing-Chuan Bai and Shyue-Tsong Shen and J. C.-M Li},
  journal={16th Asian Test Symposium (ATS 2007)},
  year={2007},
  pages={425-432}
}
This paper presents a response inversion scan cell (RISC) technique to reduce the peak capture power in test mode. The RISC technique inverts the data input of selected scan cells so that peak capture power is reduced. According to the experimental data on ISCAS'89 benchmark circuits, the RISC technique effectively reduces the peak capture power by 45% at a cost of 7.6% area overhead. The presented technique requires minimum change in the existing design for testability (DFT) methodology and it… CONTINUE READING

Citations

Publications citing this paper.
Showing 1-6 of 6 extracted citations

References

Publications referenced by this paper.
Showing 1-10 of 16 references

Similar Papers

Loading similar papers…