Resonant frustrated-total-reflection technique for the characterization of thin films.

@article{Bosacchi1982ResonantFT,
  title={Resonant frustrated-total-reflection technique for the characterization of thin films.},
  author={Bruno Bosacchi and Robert C. Oehrle},
  journal={Applied optics},
  year={1982},
  volume={21 12},
  pages={
          2167-73
        }
}
The resonant FTR technique for the characterization of thin films is presented. In this technique the film under study is incorporated in an appropriate optical cavity configuration, and information on its parameters is obtained from the values of wavelength and/or incidence angle for which resonances occur in the optical response of the structure. After a review of the basic principles and a discussion of the practical implementation of the technique, we report as examples some results of its… 
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Optical bistability in the frustrated-total-reflection optical cavity.
TLDR
It is shown that optical bistability may occur at lower incident power than in the nonlinear interface system in the frustrated-total-reflection FTR configuration.
Coupled-cavity configuration for optical bistability
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There is a need to measure height of an object at the micro/nanoscales. The electron speckle method [1] can measure in-plane distance and strain of an object but it cannot be applied to measuring…
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Optical coatings have been in use for decades and a number of optical techniques have been used to characterize them but these all utilize only very short optical distances within the film. Guided…
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We report theory and experiment on modes of propagating light waves in deposited semiconductor films. The modes are excited by a novel prism‐film coupler which is also used for the measurement of…
An Evaluation of the Prism Coupler for Measuring the Thickness and Refractive Index of Dielectric Films on Silicon Substrates