# Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models

@article{Bennett2013ResistanceIT,
title={Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models},
author={Douglas A. Bennett and Daniel S Swetz and Daniel R. Schmidt and J. N. Ullom},
journal={Physical Review B},
year={2013},
volume={87},
pages={020508}
}
• Published 25 January 2013
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• Physical Review B
The transition between the superconducting and normal states is of extreme practical importance because the very sharp onset of resistance in voltage biased thin films is the basis for transition-edge sensors (TESs). TESs are being successfully utilized in many new instruments despite the fact that there is no consensus model that describes the resistance as a function of both temperature and current R(T ,I ). A new model assuming a TES can be described as a resistively shunted junction (RSJ…

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