• DOI:10.1103/PHYSREVB.87.020508
• Corpus ID: 124754513

Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models

@article{Bennett2013ResistanceIT,
  title={Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models},
  author={Douglas A. Bennett and Daniel S Swetz and Daniel R. Schmidt and J. N. Ullom},
  journal={Physical Review B},
  year={2013},
  volume={87},
  pages={020508}
}

• D. Bennett, D. Swetz, +1 author J. Ullom
• Published 25 January 2013
• Physics
• Physical Review B

The transition between the superconducting and normal states is of extreme practical importance because the very sharp onset of resistance in voltage biased thin films is the basis for transition-edge sensors (TESs). TESs are being successfully utilized in many new instruments despite the fact that there is no consensus model that describes the resistance as a function of both temperature and current R(T ,I ). A new model assuming a TES can be described as a resistively shunted junction (RSJ) has generated much interest. Here we compare the predictions of this model with the predictions of a two-fluid model and measured data. Except for some small TESs (characteristic size <125 μm), the data are not consistent with the RSJ model but are consistent with the two-fluid model.