Residual-based localization and quantification of peaks in x-ray

@inproceedings{D2008ResidualbasedLA,
  title={Residual-based localization and quantification of peaks in x-ray},
  author={D. and Mergel},
  year={2008}
}
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References

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Showing 1-10 of 22 references

Oxygen incorporation in thin films of In 2 O 3 : Sn prepared by radio frequency sputtering

  • D. MERGEL, W. STASS, G. EHL, D. BARTHEL
  • J . Appl . Phys .
  • 2000
Highly Influential
3 Excerpts

Practical Methods of Optimization, 2nd ed

  • R. FLETCHER
  • 2000
Highly Influential
1 Excerpt

A geometric interpretation of the multiresolution criterion in nonpara

  • T. DAVIES ET AL. MILDENBERGER
  • 2008
1 Excerpt

A geometric interpretation of the multiresolution criterion in nonparametric regression

  • T. MILDENBERGER
  • J . Nonparametr . Statist .
  • 2008
1 Excerpt

Thin films of ITO as transparent elextrodes

  • D. MERGEL
  • Vakuum in Forschung und Praxis
  • 2006
1 Excerpt

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