Research on Storage Life of Electronic Equipment Based on Goodness of Fit Test Method

@inproceedings{Wang2012ResearchOS,
  title={Research on Storage Life of Electronic Equipment Based on Goodness of Fit Test Method},
  author={Jun Sheng Wang and Jin Huang Wu and Yi Dong Wang and Jun Wei Lei},
  year={2012}
}
The test of distribution is to infer that whether the life of produce can satisfy the distribution chosen by a simple analysis of the test data or the alive using data . Based on the principle of fit goodness test and the Pearson test method , which is one of a common distribution test methods, a kind of special F test method is researched for the situation that the product life obeys to exponential distribution. With that method, the distribution of the storage life of electronic devices is… CONTINUE READING

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