Will Future Measurement Needs of the Semiconductor Industry Be Met?
- Herbert S. Bennett
- Journal of research of the National Institute of…
− Analysis test (parameter analysis) is very important in measurement and test of IC parameters. The key to solve analysis test problems is how to find out optimal characteristic variable group. In this paper, the mathematical model and application method of choosing characteristic variable group are described with the obtained experimental results. It provides the interrelation of IC variables and their effects on the device operating state.