Reliable digital circuits design using sigma-delta modulated signals

@article{Schler2005ReliableDC,
  title={Reliable digital circuits design using sigma-delta modulated signals},
  author={Erik Sch{\"u}ler and Luigi Carro},
  journal={20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT'05)},
  year={2005},
  pages={314-324}
}
As the transistor gate length goes straightforward to the sub-micron dimension, the possibilities of occurrence of external interferences in these devices also increase. Moreover, the process variability further degrade this scenario. The direct effect of such external and/or intrinsic interferences is, in many cases, the total mismatch between the desired answer of the system and the achieved answer resulting from single bit flips. This way, new techniques must be studied in order to guarantee… CONTINUE READING
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References

Publications referenced by this paper.
Showing 1-10 of 16 references

A summary review of displacement damage from high-energy radiation in silicon semiconductors and semiconductor devices

G. C. Messenger
IEEE Transactions on Nuclear Science, • 1992
View 6 Excerpts
Highly Influenced

Simulation and Analysis of Transient Faults in Digital Circuits

F. L. Yang, R. A. Saleh
IEEE Journal of Solid-State Circuits, • 1992
View 6 Excerpts
Highly Influenced

Increasing fault tolerance to multiple upsets using digital sigma-delta modulators

11th IEEE International On-Line Testing Symposium • 2005
View 1 Excerpt

Arithmetic operators robust to multiple simultaneous upsets

19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. • 2004
View 3 Excerpts

Time-redundant recovery policy of TMR failures using rollback and roll-forward methods

J. Yoon, H. Kim
IEEE Proceedings Computers and Digital Techniques, • 2000
View 1 Excerpt

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