Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area

@article{Pan2012ReliabilityOO,
  title={Reliability optimization of analog integrated circuits considering the trade-off between lifetime and area},
  author={Xin Pan and Helmut E. Graeb},
  journal={Microelectronics Reliability},
  year={2012},
  volume={52},
  pages={1559-1564}
}

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