Reliability of n-Type Organic Field Effect Transistors

@inproceedings{Ahmed2015ReliabilityON,
  title={Reliability of n-Type Organic Field Effect Transistors},
  author={Rizwan Ahmed and Helmut Sitter},
  year={2015}
}
The long time operational stability of C60 based n-type organic field effect transistors (OFETs) was investigated. The changes in the device characteristics were monitored under different conditions of bias stress up to 3000 hours. By measuring several cycles of measurements of transfer and output characteristics, the long time stability of C60 based OFETs and their reproducibility was documented. The major instability of the threshold voltage, was caused by trapping of charges in the active… CONTINUE READING