Reliability of 10Gb/s 850nm oxide confined vertical cavity surface emitting lasers

Abstract

High temperature operating life test was used to evaluate the reliability of 10Gb/s 850nm Oxide Confined Vertical Cavity Surface Emitting Lasers(VCSELs) provided by Oclaro Inc. Two kinds of failure phenomenons encountered during the experiment were studied and the possible failure mechanisms were given.

Cite this paper

@article{Haijie2013ReliabilityO1, title={Reliability of 10Gb/s 850nm oxide confined vertical cavity surface emitting lasers}, author={Meng Haijie and Zhang Zhenfeng and Wang Shancheng and Ding Guoqing and Zhou Zhonghua}, journal={Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)}, year={2013}, pages={758-761} }